VLSI Test Principles and Architectures : Design for Testability by Laung-Terng Wang - Hardback

VLSI Test Principles and Architectures : Design for Testability by Laung-Terng Wang - Hardback

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SKU:
9780123705976
UPC:
9780123705976

Product Description

ISBN: 9780123705976
TITLE: VLSI Test Principles and Architectures : Design for Testability
AUTHOR: Laung-Terng Wang
PUBLISHER: Elsevier Science & Technology
PUBLISHER DATE: 14 Aug 2006

Other Details

ISBN:
9780123705976
Author:
Laung-Terng Wang
Publisher:
Elsevier Science & Technology
Publisher Date:
14 Aug 2006
Book Format:
Hardback

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