System-on-Chip Test Architectures : Nanometer Design for Testability Volume . by Laung-Terng Wang - Hardback

System-on-Chip Test Architectures : Nanometer Design for Testability Volume . by Laung-Terng Wang - Hardback

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SKU:
9780123739735
UPC:
9780123739735

Product Description

ISBN: 9780123739735
TITLE: System-on-Chip Test Architectures : Nanometer Design for Testability Volume .
AUTHOR: Laung-Terng Wang
PUBLISHER: Elsevier Science & Technology
PUBLISHER DATE: 8 Jan 2008

Other Details

ISBN:
9780123739735
Author:
Laung-Terng Wang
Publisher:
Elsevier Science & Technology
Publisher Date:
8 Jan 2008
Book Format:
Hardback

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