Testing Reliability & Appltcns of Optoelectronic : 4285 (Proceedings of Spie--the International Society for Optical Engineering, V. 4285.) by Chin - Paperback

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SKU:
9780819439635
UPC:
9780819439635

Product Description

ISBN: 9780819439635
TITLE: Testing Reliability & Appltcns of Optoelectronic : 4285 (Proceedings of Spie--the International Society for Optical Engineering, V. 4285.)
AUTHOR: Chin
PUBLISHER: SPIE Press
PUBLISHER DATE: 30 Jun 2006

Other Details

ISBN:
9780819439635
Author:
Chin
Publisher:
SPIE Press
Publisher Date:
30 Jun 2006
Book Format:
Paperback