Process and Materials Characterization and Diagnostics in IC Manufacturing : II (Proceedings of SPIE) by Tobin - Paperback

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SKU:
9780819448460
UPC:
9780819448460

Product Description

ISBN: 9780819448460
TITLE: Process and Materials Characterization and Diagnostics in IC Manufacturing : II (Proceedings of SPIE)
AUTHOR: Tobin
PUBLISHER: SPIE Press
PUBLISHER DATE: 31 Jul 2003

Other Details

ISBN:
9780819448460
Author:
Tobin
Publisher:
SPIE Press
Publisher Date:
31 Jul 2003
Book Format:
Paperback