Metrology, Inspection, and Process Control for Microlithography XXIV by Christopher J. Raymond - Paperback

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SKU:
9780819480521
UPC:
9780819480521

Product Description

ISBN: 9780819480521
TITLE: Metrology, Inspection, and Process Control for Microlithography XXIV
AUTHOR: Christopher J. Raymond
PUBLISHER: SPIE Press
PUBLISHER DATE: 31 Dec 2010

Other Details

ISBN:
9780819480521
Author:
Christopher J. Raymond
Publisher:
SPIE Press
Publisher Date:
31 Dec 2010
Book Format:
Paperback