Advances in Metrology for X-Ray and EUV Optics III : 1-2 August 2010, San Diego, California, United States by Lahsen Assoufid - Paperback

Advances in Metrology for X-Ray and EUV Optics III : 1-2 August 2010, San Diego, California, United States by Lahsen Assoufid - Paperback

AED464.46
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SKU:
9780819482976
UPC:
9780819482976

Product Description

ISBN: 9780819482976
TITLE: Advances in Metrology for X-Ray and EUV Optics III : 1-2 August 2010, San Diego, California, United States
AUTHOR: Lahsen Assoufid
PUBLISHER: SPIE Press
PUBLISHER DATE: 1 Jan 2010

Other Details

ISBN:
9780819482976
Author:
Lahsen Assoufid
Publisher:
SPIE Press
Publisher Date:
1 Jan 2010
Book Format:
Paperback

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