Measurement Techniques for Radio Frequency Nanoelectronics by T.Mitch Wallis - Hardback

Measurement Techniques for Radio Frequency Nanoelectronics by T.Mitch Wallis - Hardback

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SKU:
9781107120686
UPC:
9781107120686

Product Description

ISBN: 9781107120686
TITLE: Measurement Techniques for Radio Frequency Nanoelectronics
AUTHOR: T.Mitch Wallis
PUBLISHER: Cambridge University Press
PUBLISHER DATE: 14 Sep 2017

Other Details

ISBN:
9781107120686
Author:
T.Mitch Wallis
Publisher:
Cambridge University Press
Publisher Date:
14 Sep 2017
Book Format:
Hardback

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