RF and Microwave Modeling and Measurement Techniques for Field Effect Transistors by Jianjun Gao - Hardback

AED568.25
(0) Write a Review
SKU:
9781891121890
UPC:
9781891121890

Product Description

ISBN: 9781891121890
TITLE: RF and Microwave Modeling and Measurement Techniques for Field Effect Transistors
AUTHOR: Jianjun Gao
PUBLISHER: SciTech Publishing Inc
PUBLISHER DATE: 30 Jun 2010

Other Details

ISBN:
9781891121890
Author:
Jianjun Gao
Publisher:
SciTech Publishing Inc
Publisher Date:
30 Jun 2010
Book Format:
Hardback