Transmission Electron Microscopy of Semiconductor Nanostructures : An Analysis of Composition and Strain State : v. 182 by Andreas Rosenauer - Hardback

Transmission Electron Microscopy of Semiconductor Nanostructures : An Analysis of Composition and Strain State : v. 182 by Andreas Rosenauer - Hardback

AED620.00
(0) Write a Review
SKU:
9783540004141
UPC:
9783540004141

Product Description

ISBN: 9783540004141
TITLE: Transmission Electron Microscopy of Semiconductor Nanostructures : An Analysis of Composition and Strain State : v. 182
AUTHOR: Andreas Rosenauer
PUBLISHER: Springer-Verlag Berlin and Heidelberg GmbH & Co. K
PUBLISHER DATE: 13 Feb 2003

Related Products

Popular Trending Products