Point Defects in Semiconductors II : Experimental Aspects : 35 by J. Bourgoin - Paperback

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SKU:
9783642818349
UPC:
9783642818349

Product Description

ISBN: 9783642818349
TITLE: Point Defects in Semiconductors II : Experimental Aspects : 35
AUTHOR: J. Bourgoin
PUBLISHER: Springer-Verlag Berlin and Heidelberg GmbH & Co. K
PUBLISHER DATE: 8 Dec 2011