Product Description
ISBN: 9783642818349
TITLE: Point Defects in Semiconductors II : Experimental Aspects : 35
AUTHOR: J. Bourgoin
PUBLISHER: Springer-Verlag Berlin and Heidelberg GmbH & Co. K
PUBLISHER DATE: 8 Dec 2011
ISBN: 9783642818349
TITLE: Point Defects in Semiconductors II : Experimental Aspects : 35
AUTHOR: J. Bourgoin
PUBLISHER: Springer-Verlag Berlin and Heidelberg GmbH & Co. K
PUBLISHER DATE: 8 Dec 2011
Popular Trending Products
ISBN: 9789401086165TITLE: Defects and Properties of Semiconductors : Defect Engineering : 3AUTHOR: J…
ISBN: 9781945291227TITLE: Point defects in group IV semiconductors : common structural and physico-c…
ISBN: 9789027723529TITLE: Defects and Properties of Semiconductors : Defect Engineering : 3AUTHOR: J…