Digital Noise Monitoring of Defect Origin : 2 by Telman Aliev - Paperback

Digital Noise Monitoring of Defect Origin : 2 by Telman Aliev - Paperback

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SKU:
9781441944108
UPC:
9781441944108

Product Description

ISBN: 9781441944108
TITLE: Digital Noise Monitoring of Defect Origin : 2
AUTHOR: Telman Aliev
PUBLISHER: Springer-Verlag New York Inc.
PUBLISHER DATE: 24 Nov 2010

Other Details

ISBN:
9781441944108
Author:
Telman Aliev
Publisher:
Springer-Verlag New York Inc.
Publisher Date:
24 Nov 2010
Book Format:
Paperback

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