Introduction to Focused Ion Beam Nanometrology by David C. Cox - Hardback

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SKU:
9781643278469
UPC:
9781643278469

Product Description

ISBN: 9781643278469
TITLE: Introduction to Focused Ion Beam Nanometrology
AUTHOR: David C. Cox
PUBLISHER: Morgan & Claypool Publishers
PUBLISHER DATE: 30 Oct 2015

Other Details

ISBN:
9781643278469
Author:
David C. Cox
Publisher:
Morgan & Claypool Publishers
Publisher Date:
30 Oct 2015
Book Format:
Hardback