ISBN: 9789811074691
TITLE: VLSI Design and Test : 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers : 711
AUTHOR: Brajesh Kumar Kaushik
PUBLISHER: Springer Verlag, Singapore
PUBLISHER DATE: 22 Dec 2017
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